RAMCHECK LX Testers RAMCHECK LX DDR3/2 RAMCHECK LX DDR3 RAMCHECK LX DDR2 RAMCHECK LX DDR1 RAMCHECK LX Base Tester Optional Adapters 240-pin DDR3 DIMM 204-pin DDR3 SO-DIMM adapter 204-pin DDR3 SO-DIMM converter 240-pin DDR2 DIMM 200-pin DDR2 SO-DIMM adapter 200-pin DDR2 SO-DIMM converter 184-pin DDR Pro 200-pin DDR SO-DIMM converter 100-pin DDR SODIMM 66-pin DDR Chip DDR2 MiniDIMM 168-pin SDRAM 144-pin SDRAM SO-DIMM 100-pin SDRAM SO-DIMM SDRAM Chip 200-pin Sun DIMM 50-pin EDO TSOP EDO/FPM SOJ 72-pin SODIMM 30/72-pin SIMM Which System Is For Me? Why Buy From Us? Why Test Memory? Int'l Distributors How to Purchase Tech Support Service & Upgrades Manuals Software Downloads FAQ Site Map Home Contact us at (281) 879-6226 sales@innoventions.com

RAMCHECK DDR2 240-PIN ADAPTER Introducing the RAMCHECK DDR2 Adapter (p/n INN-8668-15), our second generation 800MHz advanced memory test adapter for RAMCHECK or RAMCHECK LX The RAMCHECK DDR2 adapter supports testing of 240-pin PC2-3200, PC2-4300, PC2-5300/PC2-5400 and PC2-6400 DDR2 memory, including unbuffered and registered modules (ECC and non-ECC) that comply with JEDEC standards. The new DDR2 adapter plugs into the existing RAMCHECK or RAMCHECK LX base tester. This makes the DDR2 adapter by far the most cost-effective solution for testing modern high-speed DDR2 modules. In fact, its features are what you would expect to find in test equipment that costs $20,000 or more. Click here to download the one page spec sheet. Don't let the adapter's small size fool you! High speed operations require short connections, while the adapter is loaded with state-of-the-art electronic components. No special setup is required. As with all of our products, the adapter is extraordinarily simple to use. Insert the adapter, turn the RAMCHECK/RAMCHECK LX tester on, place a module into the test socket, then press the start button. We have incorporated state-of-the-art technology into the design of the new RAMCHECK DDR2 Adapter. The following pictures provide you with a look "under the hood."        DDR2 Advanced Technology  1. State-of-the-art controller featuring our improved 800MHz second generation DDR2 test engine. 2. State-of-the-art high efficiency switching power regulator to generate the DDR2 STTL-18 interface power source. 3. Advanced analog section for measuring the module's current, voltages and the board's temperature. 4. Digitally-controlled high resolution VDD regulator. 5. 333-1100MHz DDR2 clock generator. 6. Digitally-controlled high resolution VDD high efficiency switching power regulator. The new RAMCHECK DDR2 adapter includes many new features which are relevant to the differences between the DDR2 technology and the older DDR technology. It also includes many of the advanced features first introduced with our DDR Pro. Please see the screen shots below. Introducing the RAMCHECK DDR2 RAMCHECK automatically identifies the presence of the new DDR2 adapter. RAMCHECK prompts the user to insert a 240-pin DDR2 module and start the test with F1.    BASIC TEST Basic Test screen shows the size, the speed, the voltage, the test pattern, the module's bank and the CAS Latency. This example shows testing at 667MHz with an automatic setting of CAS Latency to the default value of CL=4 for this frequency. In this Basic Test screen we test a 32Mx72 ECC module at 533MHz with the default CAS Latency of 4. This module is unbuffered. In this Basic Test screen we test a 128Mx64 (1GB) module at 533MHz with a reduced CAS Latency of 3. Some 533MHz modules which are normally designed for CL=4 may still pass tests conducted at the more demanding CL=3. The new DDR2 adapter supports all popular Registered modules. In this Basic Test screen we test a Registered 128Mx72 (1GB) module at 533Hz with the default CAS Latency of 4. In this Basic Test screen we test an Unbuffered 128Mx72 (1GB) module at 400MHz with the default CAS Latency of 3. In addition to the industry standard frequencies of 400MHz, 533MHz and 667MHz, we also offer testing at the additional frequencies of 600MHz and 466MHz. These frequencies can be used to gauge if a given module can run at slightly higher frequencies than it is marked for. This screen appears upon a successful completion of the Basic Test. It is followed with several detailed screens with detailed information about the module's size and structure. A PC2-6400 module can be tested at the maximum 667MHz speed of the DDR2, although the module may run at 800MHz (at the proper setup of CAS Latency and Voltage) in the application. The adapter is fully compatible with the PC2-6400 modules while testing them at a slower speed. PC2-5400/4200/3200 are tested at their nominal maximum speed as shown in the table below. This sample structure information screen indicates that the module was tested at the default 1.80V. CAS Latency was the default 3/4 setting, in which the program automatically select CL=4 for frequencies of 533MHz and higher. An abundance of test results are automatically entered into the Test Log. This sample Test Log screen indicates that the module was tested at 1.90V. Its size of 512MB is made of individual chips of 4x16Mx8, namely 4 chip banks, 16Mb size and width of 8 bits per chip. This sample structure information screen states that the currently tested PC2-6400 module has its SPD set for 800MHz at CL 5 and 667MHz at CL4.    PARAMETERS, CHANGE-ON-THE-FLY AND SETUP Expanded CHANGE-ON-THE-FLY can be used to set up the Frequency, the Voltage, the CAS LATENCY and the Refresh rate only for the current test. Following the current test, it returns to the current setup parameters. Here we demonstrate how the module's frequency is overrided to 667MHz from a previous test at 533MHz. CAS Latency can be set at 2,3,4,5,6. Please note that not all DDR2 modules support CL of 2 and 6. By default, the test program selects CL=3 for 400MHz and 466MHz, and CL=4 for 533MHz and 667Mhz. At 667MHz, the test program dynamically tries to test the module at CL=5 if CL=4 fails. This example shows testing at 533MHz with a forced CAS Latency of CL=5. This test ended successfully. The new DDR2 VDD Voltage setup allows the user to change on-the-fly the test voltage in the range 1.5V-2.2V. When set to AUTO, RAMCHECK automatically tests the module at 1.8V/1.9V. In this example, the user is selecting a VDD of 1.94 Volt.    WIRING ERRORS DETECTION Unlike older DDR, the DDR2 devices utilize the differential DQS technique which assigns a pair of two control lines per each DQS. In this test error example, DQS4 line (pin 84) was stuck at 1. The DDR2 module uses new ODT control line. In this test error example, line ODT1 (pin 77) is shorted to ground.    EXTENSIVE TEST During Voltage Cycling, the module is tested at various voltages, which are automatically selected based on the current frequency. Higher frequencies require higher voltages. The March UP/DOWN test attempts to capture pattern sensitivity and addressing errors. The Extensive Test ends with the Final Test. The module is heated up by this point so that the test indicates the ability of the module to work at elevated temperature.     AUTO-LOOP TEST The AUTO-LOOP test is great for extended burn-in. This test continues forever when there are no failures in the device. It is terminated by the user. It similarly follows our standard AUTO-LOOP for SDRAM and DDR1 devices. As with all of our RAMCHECK testers, each module's size, structure, and type are automatically detected, without the need for user's setup. The test flow follows our standard Basic Test, Extensive Test, and Auto-Loop process. The RAMCHECK DDR2 adapter is very simple to operate, with little training or setup required. When ordering, please reference RAMCHECK DDR2 Adapter part number: INN-8668-15. Please note that older RAMCHECK base testers may require a hardware upgrade in order to use the DDR2 adapter. Please refer to this RAMCHECK upgrade page for more details. Please click here for the DDR2 Adapter manual addendum.

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