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BASIC TEST
Although it lasts only a few seconds, the Basic Test provides you with a great deal of information about the memory module.
Pressing one button activates the Basic Test, which automatically measures and displays the module size, mode type, fastest functional frequency rate (or fastest RAS access time in nanoseconds for EDO/FPM memory), and more. The BASIC test concludes with detailed structure information. You have the option to terminate the procedure at this point, as this test is sufficient for most testing needs, however, if you decide to test the module more rigorously, you may elect to continue to the next phase.
RAMCHECK has been equipped with advanced setup capabilities to satisfy the needs of even the most demanding engineers. Major timing parameters can be accessed through a graphic interface, the standard test flow can be customized, or you may choose to edit the patterns used throughout the test.
As shown above, RAMCHECK is testing an unbuffered (‘UBF) SDRAM module at 3V and identifies it as being 16Mx72. Registered SDRAM modules would have a “REG” notation in place of “UBF”. The screen also indicates a speed of 100MHz.
RAMCHECK also tests EDO & FPM devices without the need for special setup. As seen in the adjacent screen, RAMCHECK is testing the module at the 5V-voltage level, identifies its size as being 16Mx72 and states that it operates in Fast Page Mode. The speed notation of 63/150nS indicates that the module has an access time of 63nS, and a cycle time of 150nS (Please refer to Appendix D for further information on Cycle Time Measurement).
A dynamic graphic representation of the individual bytes and the HEX test patterns is shown as the test progresses. Every memory cell of the DUT (Device Under Test) is fully tested several times to insure detection of all “stuck at” type failures. The BASIC TEST is followed by a few structure screens.
The BASIC TEST is sufficient for most of your memory testing needs, so you can press ESC to terminate the current test.
You may leave the module on for the next major test, the EXTENSIVE test, which gives you a more thorough and comprehensive procedure. This test lasts a few minutes depending upon module size.
Within the EXTENSIVE test are different individual test phases. The initial phase is Voltage Cycling, which uses varying patterns on the DUT, while the voltage is applied at different levels from 3.0V to 3.6V (or 4.50V through 5.50V if applicable).
The MODE Analysis test follows, giving information on the detection of FAST PAGE, EDO MODE, and SDRAM as well as other DRAM modes of operation.
Next is the Voltage Bounce test, which repeatedly reads and writes to the module while the voltage is bounced from the upper and lower extremes.
The MARCH UP/DOWN test then begins testing for adjacent cell interference, using data patterns that are more likely to reveal such a problem.
Relative Refresh and Relative Spikes. Relative Refresh tests for data retention between refresh cycles. The figure given is only for comparative measurements, and is not an absolute value, that is, a chip having a relative value of '5' retained data integrity twice as that with a value of '4'. The Relative Spikes test phase performs a data retention test while the module is subjected to various sizes of voltage spikes.
The next phase in the EXTENSIVE TEST is the CHIP HEAT MODE, which is designed to raise the module's temperature. The FINAL TEST portion of the EXTENSIVE TEST will then test the 'heated' module to determine if any speed drift or other temperature related problems have occurred.
The AUTO-LOOP test follows the EXTENSIVE test. This test will continuously test the module with different patterns of data bits. The AUTO-LOOP test will terminate only when an error is encountered, or when the user intervenes and stops the test manually. Therefore, the AUTO-LOOP test provides you with perfect BURN-IN capabilities.
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Clear messages identify good and bad modules. Successful tests result in high pitch beeps, while errors sound low pitch signals. |
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Scrollable error menus provide a graphic display of the error and its associated pin number. |
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Address wiring errors are explicitly shown. |
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Variations from the standard devices are clearly indicated. |
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Structure information at the end of Basic Test indicates which control signals are used! |
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A detailed Test Log including all the test results can be viewed after every test by simply pressing F4. |
TEST PHASES:
RAMCHECK tests have been significantly enhanced over our previous generation, resulting in more support for today's memory devices, as well as added test results not available before.
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BASIC Test quickly checks all the wiring and all the memory cells. Speed shown here is 133MHz. |
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EXTENSIVE Test includes many tests that give you more insight into the quality of your memory. |
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AUTO LOOP Test checks the memory with endless changing patterns. It is also perfect for burn-in operation. |
SETUP:
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Menus for setup and other operations are clear and interactive. |
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Graphic setup of timing parameters will please most advanced users. |
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Detailed setup list keeps track of all (optional) changes you made to the default program. |
Please click here for pricing and further information, or call INNOVENTIONS at
(281) 879-6226.