RAMCHECK® DDR3 204-pin SO-DIMM Test Adapter
The RAMCHECK DDR3 SO-DIMM Adapter (p/n INN-8668-17) is the latest test adapter for the RAMCHECK LX memory tester. The 204-pin DDR3 SO-DIMM adapter is explicitly designed for x64 (non ECC) SO-DIMM modules. These SO-DIMM modules follow the JEDEC standard. (A small minority of the SO-DIMM modules are ECC (x72 bits) and they have a completely different wiring. We plan to support these modules later when demands increases and their JEDEC standard is finalized.)
The DDR3 adapter plugs into the existing RAMCHECK or RAMCHECK LX base tester, with no special setup required. The adapter is very simple to use: Just insert the adapter, turn the RAMCHECK/ RAMCHECK LX tester on, place a module into the test socket, then press the start button.
Unlike the DDR3 SO-DIMM converter solution which is used with the DDR3 DIMM adapter, this adapter is self-contained and features a rugged Yamaichi test socket manufactured specifically for high-volume testing, with a tested rating of about 10,000 insertion cycles.
As with all of our RAMCHECK/RAMCHECK LX test adapters, each module's size, structure, and type are automatically detected, without the need for user's setup. The test flow follows our standard Basic Test, Extensive Test, and Auto-Loop process. The RAMCHECK DDR3 SO-DIMM adapter is very simple to operate, with little training or setup required.
|RAMCHECK LX includes a large, vivid, high-contrast display measuring 2.7" x 1.43" (69mm x 36.5mm). Easily viewable at an angle, up to 3-4 feet away. Seen here is the startup screen once the RAMCHECK LX is turned on.|
|RAMCHECK LX prompts the user to insert a 204-pin DDR3 module and start the test with F1.|
|Basic Test screen shows the size, the speed, the voltage, the test pattern, the module's bank and the CAS Latency. This example shows testing at 1066MHz with an automatic setting of CAS Latency to the default value of CL=6 for this frequency.|
|Successful test phases conclude with a clear 'Pass' message and with distinguishing sound tones. Important parameters are shown in this screen, followed by a detailed test results summary screen.|
|This sample structure information screen indicates that the module was tested at the default 1.50V. CAS Latency was the automatically selected value of CL=7. Other values may be selected automatically (or by the user) for different frequencies.|
|Test Log collects and retains all intermediary test results while the memory devices undergo all of the test phases. The Test Log remains until a new test is initiated. The Test Log may be uploaded to a PC for printing via the USB interface. You can also save the file.|
|Change-on-the-fly and Setup|
|Expanded CHANGE-ON-THE-FLY can be used to set up the Frequency, the Voltage, the CAS LATENCY and the Refresh rate only for the current test. Following the current test, it returns to the current setup parameters.|
|Here we demonstrate how the module's frequency is overriden to 866MHz from a previous test at 800MHz.|
|CAS Latency can be set at 5,6,7,8,9,10,11, and 12. Please note that not all DDR3 modules support all CL values.|
|Various Rtt_NOM and Rtt_WR (dynamic Rtt) can be set up by the user.|
|The DDR3 VDD Voltage setup allows the user to change on-the-fly the test voltage in the range 1.35V-1.8V. When set to AUTO, RAMCHECK automatically tests the module at 1.5V/1.6V. In this example, the user is selecting a VDD of 1.57 Volt.|
|Wiring Errors Detection|
|The DDR3 devices utilize the differential DQS technique which assigns a pair of two control lines per each DQS. In this test error example, DQS4 line (pin 84) was stuck at 1.|
|Address lines errors in the DDR3 modules are reported explicitly as shown in this example. Here address line A2 (pin 61) is shorted to ground.|
|The DDR3 module uses ODT control lines to activate the internal Rtt termination resistors. In this test error example, line ODT0 (pin 195) is shorted to ground.|
|The EXTENSIVE Test performs various tests to establish memory quality.|
|VOLTAGE CYCLING performs tests under allowable voltage deviations from the recommended VDD setting.|
|MODE Test identifies various operational parameters of the device, including different bursts lengths and CAS latency settings.|
|VOLTAGE BOUNCE tests data retention during voltage variation between read and write.|
|MARCH UP/DOWN reveals adjacent cell interference problems.|
|CHIP HEAT MODE tests at elevated operating temperatures.|
|AUTO LOOP tests memory with endless pattern changes. Great for burn-in testing.|
|The RAMCHECK LX provide advanced setup features. Certain timing parameters may be selected graphically as shown here.|
|Make changes "on-the-fly" to test parameters with the push of a button.|
|The device's SPD can be conveniently viewed, edited and programmed on the RAMCHECK LX. You can also use our advanced SPD features in the PC RAMCHECK LX communications program.|
The RAMCHECK DDR3 tester can perform DDR3 tests at actual test frequencies up to 1066MHz. Modules designed for 1333MHz and 1600MHz (as well as future DDR3-1800, 1866, 2000, etc.) can be functionally tested on the DDR3 adapter but at a reduced frequency. The DDR3 test engine can achieve 1333MHz internal diagnostic speeds. Please see the product specifications for futher details.
|Test at full frequency||Test at full frequency||Test at lower frequency||Test at lower frequency|
Please make sure that your base tester (RAMCHECK LX or RAMCHECK) always has the latest firmware installed.
When ordering, please reference RAMCHECK DDR3 SO-DIMM Adapter part number INN-8668-17. This adapter is already compatible with all current RAMCHECK LX units. Note that older RAMCHECK base testers may require a factory hardware upgrade in order to use the DDR3 SO-DIMM adapter. Please refer to this RAMCHECK upgrade page for more details.