The RAMCHECK DDR3 Adapter (p/n INN-8668-16) supports testing of 240-pin PC3-6400, PC3-8500, PC3-10600, and PC3-12800 DDR3 memory, including unbuffered (UDIMM) and registered modules (RDIMM), both ECC and non-ECC, that comply with JEDEC standards, and LRDIMM (RAMCHECK LX only).
The DDR3 adapter plugs into the existing RAMCHECK or RAMCHECK LX base tester. This makes the DDR3 adapter by far the most cost-effective solution for testing modern high-speed DDR3 modules. In fact, its features are what you would expect to find in test equipment that costs $20,000 or more.
Don't let the adapter's small size fool you! High speed operations require short connections, while the adapter is loaded with state-of-the-art electronic components.
No special setup is required. As with all of our products, the adapter is extraordinarily simple to use. Insert the adapter, turn the RAMCHECK/RAMCHECK LX tester on, place a module into the test socket, then press the start button.
We have incorporated state-of-the-art technology in the design of the new RAMCHECK DDR3 Adapter.
|1.||Main controller featuring our improved 1066MHz test engine.|
|2.||High efficiency switching power regulator to generate the DDR3 STTL-15 interface power source.|
|3.||Advanced analog section for measuring the module's current, voltages and the board's temperature.|
|4.||Digitally-controlled Vtt regulator.|
|5.||400-1333MHz DDR3 clock generator.|
|6.||Digitally-controlled high resolution VDD high efficiency switching power regulator.|
The RAMCHECK DDR3 adapter includes many new features which are relevant to the differences between DDR3 technology and the older DDR2 and DDR technology.
As with all of our RAMCHECK/RAMCHECK LX testers, each module's size, structure, and type are automatically detected, without the need for user's setup. The test flow follows our standard Basic Test, Extensive Test, and Auto-Loop process. The RAMCHECK DDR3 adapter is very simple to operate, with little training or setup required.
|RAMCHECK LX DDR3/DDR2 includes a large, vivid, high-contrast display measuring 2.7" x 1.43" (69mm x 36.5mm). Easily viewable at an angle, up to 3-4 feet away. Seen here is the startup screen once the RAMCHECK LX DDR3/DDR2 is turned on.|
|Basic Test screen shows the size, the speed, the voltage, the test pattern, the module's bank and the CAS Latency. This example shows testing at 1066MHz with an automatic setting of CAS Latency to the default value of CL=6 for this frequency.|
|Successful test phases conclude with a clear 'Pass' message and with distinguishing sound tones. Important parameters are shown in this screen, followed by a detailed test results summary screen.|
|Test results summary screens provide a wealth of information after each test phase. All summary screens are also added to the Test Log.|
|Test Log collects and retains all intermediary test results while the memory devices undergo all of the test phases. The Test Log remains until a new test is initiated. The Test Log may be uploaded to a PC for printing via the USB interface. You can also save the file.|
|The EXTENSIVE Test performs various tests to establish memory quality.|
|VOLTAGE CYCLING performs tests under allowable voltage deviations from the recommended VDD setting.|
|MODE Test identifies various operational parameters of the device, including different bursts lengths and CAS latency settings.|
|VOLTAGE BOUNCE tests data retention during voltage variation between read and write.|
|MARCH UP/DOWN reveals adjacent cell interference problems.|
|CHIP HEAT MODE tests at elevated operating temperatures.|
|AUTO LOOP tests memory with endless pattern changes. Great for burn-in testing.|
|Change-on-the-fly and Setup|
|Expanded CHANGE-ON-THE-FLY can be used to set up the Frequency, the Voltage, the CAS LATENCY and the Refresh rate only for the current test. Following the current test, it returns to the current setup parameters.|
|Here we demonstrate how the module's frequency is overriden to 866MHz from a previous test at 800MHz.|
|CAS Latency can be set at 5,6,7,8,9,10,11, and 12. Please note that not all DDR3 modules support all CL values.|
|Various Rtt_NOM and Rtt_WR (dynamic Rtt) can be set up by the user.|
|The DDR3 VDD Voltage setup allows the user to change on-the-fly the test voltage in the range 1.35V-1.8V. When set to AUTO, RAMCHECK automatically tests the module at 1.5V/1.6V. In this example, the user is selecting a VDD of 1.57 Volt.|
|The RAMCHECK LX provide advanced setup features. Certain timing parameters may be selected graphically as shown here.|
|Wiring Errors Detection|
|The DDR3 devices utilize the differential DQS technique which assigns a pair of two control lines per each DQS. In this test error example, DQS4 line (pin 84) was stuck at 1.|
|Address lines errors in the DDR3 modules are reported explicitly as shown in this example. Here address line A2 (pin 61) is shorted to ground.|
|The DDR3 module uses ODT control lines to activate the internal Rtt termination resistors. In this test error example, line ODT0 (pin 195) is shorted to ground.|
|The device's SPD can be conveniently viewed, edited and programmed on the RAMCHECK LX. You can also use our advanced SPD features in the PC RAMCHECK LX communications program.|
The new DDR3 incorporate numerous enhancement over our previous DDR2 technology, some of which are currently implement in the diagnostic tests and will be fully enabled in upcoming firmware versions. Please make sure that your base tester (RAMCHECK LX or RAMCHECK) always has the latest firmware installed. Please note that the following technical specifications are subject to change while we introduce this new DDR3 technology.
|DDR3 Test Features|
|Supports Burst Length of 8, BC4 or 8 and BC4.|
|Supports both Read CAS LATENCY (CL) and Write CAS LATENCY (CWL) in the range of 5,6,7,8,9,10,11, and 12. Supports Additive Latency of 0, CL-1 and CL-2. Trcd is supported in the range of 4,5,6,7,8,9 and 10. Default test allows automatic selection of CL and CWL for different test phases. The user can select specific CL values using SETUP or the CHANGE-ON-THE-FLY feature.|
|Advanced timing circuitry and DCMs provides write leveling tests as well as differential delays along the input data path.|
|Support On-Die-Termination (ODT) including Rtt_NOM and dynamic ODT with Rtt_WR.|
|DDR3 Data rates : 800MHz and 1066MHz. Test engine reaches 1333Mhz on some tests. Higher speed DDR3 modules can still be tested at a lower frequency, as described below.|
|Supports new DDR3 reset function and the mode registers enhancements.|
|Test engine implement improved SRE (Self Refresh Entry) command as well as the new DDR3 long and short calibration commands (ZQCL/ZQCS).|
|Improved current and temperature measurement circuitry.|
|True 1.5V testing with a wide support range of 1.35V to 1.8V at 10mV increments. (Dual voltage DDR3L.)|
|Controlled Vtt for true STTL-15 compatibility.|
|Parallel testing capability of 64/72-bits.|
|Rugged, 240-pin test-quality ZIF socket for convenient module handling.|
|Automatic detection and support for Registered/Unbuffered modules.|
|Automatic DQS8..0/DM8..0 or DQS17..0 support.|
|Four -S control lines for up to 4-rank devices.|
|Fourteen A15..0 address lines and three BA2..0 bank select address lines to support 16GB modules.|
|Complete SPD programming support.|
|Supports converter for 204-pin S.O. DIMM modules and other future converters.|
The RAMCHECK DDR3 tester can perform DDR3 tests at actual test frequencies up to 1066MHz. Modules designed for 1333MHz and 1600MHz (as well as future DDR3-1800, 1866, 2000, etc.) can be functionally tested on the DDR3 adapter but at a reduced frequency. The DDR3 test engine can achieve 1333MHz internal diagnostic speeds. Please see the product specifications for futher details.
|Test at full frequency||Test at full frequency||Test at lower frequency||Test at lower frequency|
Please click here for pricing and further information, or call INNOVENTIONS at 1 (281) 879-6226. When ordering, please reference part number INN-8686-DDR3.