Fast, reliable memory testing for DDR2 DIMMs

Introducing the RAMCHECK DDR2 Adapter (p/n INN-8668-15), the latest advanced memory test adapter for RAMCHECK LX and RAMCHECK. The RAMCHECK DDR2 adapter supports testing of 240-pin PC2-6400, PC2-5300/PC2-5400, PC2-4300 and PC2-3200 DDR2 memory, including unbuffered (UDIMM) and registered modules (RDIMM), both ECC and non-ECC, that comply with JEDEC standards. The adapter can achieve a maximum frequency of 866MHz. (Please see this page for information about DDR2 fully-buffered FB-DIMM devices.)

The DDR2 adapter plugs into the existing RAMCHECK or RAMCHECK LX base tester. This makes the DDR2 adapter by far the most cost-effective solution for testing modern high-speed DDR2 modules. In fact, its features are what you would expect to find in test equipment that costs $20,000 or more.

Click here to download the one page spec sheet.

Don't let the adapter's small size fool you! High speed operations require short connections, while the adapter is loaded with state-of-the-art electronic components.

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No special setup is required. As with all of our products, the adapter is extraordinarily simple to use. Insert the adapter, turn the RAMCHECK/RAMCHECK LX tester on, place a module into the test socket, then press the start button.

DDR2 Advanced Technology

We have incorporated state-of-the-art technology in the design of the new RAMCHECK DDR2 Adapter.

The RAMCHECK DDR2 adapter includes many new features which are relevant to the differences between DDR2 technology and the older DDR1 technology.

As with all of our RAMCHECK/RAMCHECK LX testers, each module's size, structure, and type are automatically detected, without the need for user's setup. The test flow follows our standard Basic Test, Extensive Test, and Auto-Loop process. The RAMCHECK DDR2 adapter is very simple to operate, with little training or setup required.

DDR2 Adapter Operation

	RAMCHECK LX DDR2 includes a large, vivid, high-contrast display measuring 2.7" x 1.43" (69mm x 36.5mm). Easily viewable at an angle, up to 3-4 feet away. Seen here is the startup screen once the RAMCHECK LX DDR2 tester is turned on.
	RAMCHECK prompts the user to insert a 240-pin DDR2 module and start the test with F1.
Basic Test
	RAMCHECK LX displays the manufacturer's official speed rating of the module at the bottom line. The manufacturer specifies the speed rating based on expensive and very complex certifying test equipment. Here the module is specified for 800MHz.
	Basic Test screen also shows the time of test, the voltage (1.90V) and the module's section currently under test (B1/5 means Bank5 of Rank1). The bottom line shows the manufacturer's speed rating in the PC2-xxxx JEDEC format. The 800MHz module is PC2-6400.
	Basic Test screen shows the size, the speed, the voltage, the test pattern, the module's bank and the CAS Latency. This example shows testing at 800MHz with an automatic setting of CAS Latency to the default value of CL=5 for this frequency.
	In this Basic Test screen we test a 64Mx64 ECC module at 667MHz with the default CAS Latency of 4. This module is unbuffered.
	In this Basic Test screen we test a 128Mx64 (1GB) module at 533MHz with a reduced CAS Latency of 3. Some 533MHz modules which are normally designed for CL=4 may still pass tests conducted at the more demanding CL=3.
	The DDR2 adapter supports all popular Unbuffered, Registered modules. In this Basic Test screen we test a Unbuffered 32M64 (256MB) module at 533Hz with the default CAS Latency of 4.
	In this Basic Test screen we test a Registered 64Mx72 (512MB) module at 400MHz with the default CAS Latency of 3.
	In addition to the industry standard frequencies of 400MHz, 533MHz 667MHz and 800MHz, we also offer testing at the additional frequencies of 866MHz, 600MHz and 466MHz. These frequencies can be used to gauge if a given module can run at slightly higher frequencies than it is marked for.
Test Results
	Successful Basic Test concludes with a clear 'Pass' message and with distinguishing sound tones. Important parameters are shown in this screen, followed by detailed test results summary screens.
	This sample structure information screen indicates that the module was tested at the default 1.90V. CAS Latency was the default 3/4 setting, in which the program automatically select CL=5 for frequencies of 533MHz and higher.
	This sample structure information screen states that the currently tested PC2-6400 module has its SPD set for 800MHz at CL 5 and 667MHz at CL4.
PARAMETERS, CHANGE-ON-THE-FLY AND SETUP
	Expanded CHANGE-ON-THE-FLY can be used to set up the Frequency, the Voltage, the CAS LATENCY and the Refresh rate only for the current test. Following the current test, it returns to the current setup parameters.
	Here we demonstrate how the module's frequency is overriden to 866MHz from a previous test at 800MHz.
	CAS Latency can be set at 2,3,4,5,6. Please note that not all DDR2 modules support CL of 2 and 6. By default, the test program selects CL=3 for 400MHz and 466MHz, CL=4 for 533MHz and 667Mhz, and CL=5 for 800MHz. At 667MHz, the test program dynamically tries to test the module at CL=5 if CL=4 fails.
	This example shows testing at 800MHz with a forced CAS Latency of CL=5. This test ended successfully.
	Make changes "on-the-fly" to test parameters with the push of a button.
	The new DDR2 VDD Voltage setup allows the user to change on-the-fly the test voltage in the range 1.5V-2.2V. When set to AUTO, RAMCHECK automatically tests the module at 1.8V/1.9V. In this example, the user is selecting a VDD of 1.94 Volt.
WIRING ERRORS DETECTION
	Unlike older DDR1, the DDR2 devices utilize the differential DQS technique which assigns a pair of two control lines per each DQS. In this test error example, DQS4 line (pin 84) was stuck at 1.
	The DDR2 module uses new ODT control line. In this test error example, line ODT1 (pin 77) is shorted to ground.
Extensive Test
	The EXTENSIVE Test performs various tests to establish memory quality.
	VOLTAGE CYCLING performs tests under allowable voltage deviations from the recommended VDD setting.
	MODE Test identifies various operational parameters of the device, including different bursts lengths and CAS latency settings.
	VOLTAGE BOUNCE tests data retention during voltage variation between read and write.
	MULTI-BURST test performs our proprietary fast memory array write/read operation.
	MARCH UP/DOWN reveals adjacent cell interference problems.
	CHIP HEAT MODE tests at elevated operating temperatures.
	FINAL TEST repeats the general Basic Test at the end of the Extensive Test flow.
	Successful Extensive Test concludes with a clear 'Pass' message and with distinguishing sound tones.
AUTO-LOOP TEST
	AUTO LOOP tests memory with endless pattern changes. Great for burn-in testing.
	Each loop may use a different test pattern, and also change the test voltage. In this screen, Loop#6 uses test pattern "24242424" at 1.90V.
SPD Editor
	The device's SPD can be conveniently viewed, edited and programmed on the RAMCHECK LX. You can also use our advanced SPD features in the PC RAMCHECK LX communications program.